Opportunity at National Institute of Standards and Technology (NIST)

Atom Probe: Improving the Accuracy and Precision of 3D Atom Probe Analysis

Location

Material Measurement Laboratory, Materials Measurement Science Division

RO# Location
50.64.31.C0364 Gaithersburg, MD

Please note: This Agency only participates in the February and August reviews.

Advisers
name email phone
Meisenkothen, Frederick frederick.meisenkothen@nist.gov 301-975-5181
Description

NIST is working toward understanding and improving the accuracy and precision of spatially resolved isotopic and chemical compositional analysis in the atom probe. The development of accurate analytical approaches and reference materials for electrical and thermal conductors and insulators is critical to this program. Quantitative comparison with other bulk and microscopic methods such as 3D electron microscopy and depth profiling with secondary ion mass spectrometry is performed. We are developing an understanding of the specimen material properties and method improvements needed to improve and broaden the applicability of the technology. Improvement to laser and other instrument systems, instrument controls and automation, and modeling approaches are researched and developed. Test structures, reference materials, and modeling programs are developed in collaboration with industry and academia.

Keywords:

atom probe; mass spectrometry; tomography; dopant; chemical analysis, isotopic analysis

Eligibility

Citizenship:  Open to U.S. citizens

Level:  Open to Postdoctoral applicants

Stipend
Base Stipend Travel Allotment Supplementation
$74,950.00 $3,000.00