Opportunity at National Institute of Standards and Technology (NIST)

Depth Profiling Using Neutron Beams

Location

Material Measurement Laboratory, Chemical Sciences Division

RO# Location
50.64.61.B6989 Gaithersburg, MD

Please note: This Agency only participates in the February and August reviews.

Advisers
name email phone
Chu, Pamela M. pamela.chu@nist.gov 301.975.2988
Description

Measurement of prompt charged particle radiation from nuclear reactions is a powerful tool for elemental analysis and compositional mapping of the first few micrometers from a material surface. Neutron depth profiling (NDP) employs a cold-neutron beam from the NIST neutron source to nondestructively measure the depth distribution of nuclides of helium, lithium, boron, nitrogen, oxygen, sodium, and a few additional elements that emit charged particles upon neutron capture. Research topics include method development, focusing on improved specificity, accuracy, sensitivity, and spatial resolution through detailed studies of the interaction of neutrons and their products with samples and detectors. A few examples of technologies being explored include lithium ion battery performance, oxidation growth, man-made diamonds, magnetic thin films, and reactor wall survival.

Keywords:

Charged particles; Chemical profiling; Compositional mapping; Focused neutrons; Materials analysis; Neutron beams; Semiconductors; Lithium batteries; Non-destructive analysis;

Eligibility

Citizenship:  Open to U.S. citizens

Level:  Open to Postdoctoral applicants

Stipend
Base Stipend Travel Allotment Supplementation
$74,950.00 $3,000.00