Opportunity at National Institute of Standards and Technology (NIST)

Femtosecond Time-resolved Optical Measurements in Condensed Matter

Location

Physical Measurement Laboratory, Nanoscale Device Characterization Division

RO# Location
50.68.03.C0334 Gaithersburg, MD 20899

Please note: This Agency only participates in the February and August reviews.

Advisers
name email phone
Wahlstrand, Jared Kenneth jared.wahlstrand@nist.gov 301-975-2547
Description

Dynamics in semiconductor and other materials are studied using optical and THz pump-probe methods. Rapid changes in optical properties of materials are measured using spectral interferometry, electro-optic sampling, and other techniques. Coherent control techniques for all-optical injection of charge and spin currents, coupled with spatially-resolved pump-probe measurements, are used to study carrier transport. Changes in linear and nonlinear optical susceptibilities in an applied DC or THz electric field are also of interest, including the Franz-Keldysh effect. Materials of interest include layered semiconductors, novel 2D materials, and topological materials. Research is done in close collaboration with other groups at NIST with expertise in complementary techniques and materials growth.

Keywords:

ultrafast optics; multidimensional spectroscopy; optical spectroscopy; nonlinear optics; time-resolved spectroscopy; electro-optics; THz

Eligibility

Citizenship:  Open to U.S. citizens

Level:  Open to Postdoctoral applicants

Stipend
Base Stipend Travel Allotment Supplementation
$74,950.00 $3,000.00